CSInstruments - AFM Training Courses 2016 - New AFM feature : Magnetic Lateral Force Microscopy

CSI Instruments - AFM Training Courses 2016 - New AFM feature : Magnetic Lateral Force Microscopy
Post publication date: 
Tuesday, April 5, 2016

CSInstruments is pleased to announce the CSInstruments Atomic Force Microscopy Training Courses 2016.
It will run from the 10th to 12th May, 2016 and take place at CSInstruments factory: 2 rue de la Terre de Feu - 91940 LES ULIS- FRANCE.

This is an AFM training workshop, aimed at any researcher or scientist, who wants to learn about AFM, or increase their knowledge of the technique.

Fill the module to register and obtain more information

New AFM Feature: MLFM, Magnetic Lateral Force Microscopy

CSInstruments is pleased to announce you its new AFM feature: The MLFM, Magnetic Lateral Force Microscopy. This MLFM feature allows the users to applied a magnetic field during the measurements. This field can be changed during the scan.

  • Magnetic Field on MFM samples
  • In-situ magnetic field control
  • Real time variable magnetic field

Please check the video presentation of this new feature

Related products 

STM/AFM Microscope Nano-Observer CSI Instruments
Your Research Atomic Force Microscope

Partner 

CSI Concept Scientific Instruments