STM/AFM Microscope Nano-Observer

Your Research Atomic Force Microscope

The Nano-Observer is a flexible and powerful STM/AFM Microscope. Designed with the ultimate technologies, it combines performance and ease of use. The USB controller offers a real integrated lock-in for better measurement capability (phase detection, Piezo-Response Mode...).

A low-noise laser and a pre-alignment system provide simplicity and high resolution on a compact AFM head. Its intuitive software simplifies all AFM settings to allow quick and safe AFM acquisitions.

Compact and robust, the Nano-Observer fulfills the requirements for advanced users or beginners. It avoids laser alignment with the pre-positioned tip system. A top and side view of the tip/sample, combined with vertical motorized control, makes the pre-approach easy. Easy positioning can be done by combining the optical access with the X-Y translation stage.

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PDF icon Brochure CSI NanoObserver STM/AFM1.79 MB

Technical Features

XY Scan range 100µm (tolerance +/- 10%)
Z range 9µm ( tolerance +/- 10%)
XY drive resolution 24 bit control - 0.06 Angströms
Z drive resolution 24 bit control – 0.006 Angströms
Z noise level <0.05nm RMS
Reduced coherence laser Wavelenght 658 nm – power < 1mW
Color optical view system Top and side view
6 DAC Outputs 6 D/A Converters – 24 bit
8 ADC Inputs 8 A/D Converters – 16 bit
Data points Up to 4096
Integrated Lock-in (Oscillating mode & phase) Up to 5 MHz
Interface USB 2.0
Controller size - weight 8 cm x 20 cm x 26 cm - 2 kg
Power AC 100 – 240 V 47-63 Hz
Operating System Windows XP (SP3 & Framework.NET 3.5 SP1) or Windows 7 (32/64bit)