DVIA-MLP series

The DVIA-MLP series by Daeil Systems is a cutting-edge active vibration isolation system, specifically designed for scanning electron microscopes (SEM). This system sets a new standard in active vibration control, providing a controlled environment for high-end SEM applications.

Key Features:

• Simplified Installation: The DVIA-MLP uses a side installation method, eliminating the need to lift the microscope and increasing its height by only a few centimeters. This design ensures ergonomic compatibility with both original and aftermarket enclosures.

• Low-Profile Design: With a 34% lower height compared to major competitors, the DVIA-MLP platform offers a space-saving solution without compromising performance, making it ideal for compact environments.

• Active Vibration Control in Six Degrees of Freedom: The system handles vibrations in three translational motions (X, Y, Z) and three rotational motions (pitch, roll, yaw), ensuring optimal stability for sensitive equipment.

• Highly Sensitive Sensors: Equipped with advanced sensors, the DVIA-MLP series effectively detects low-frequency vibrations, ensuring highly accurate measurements.

• High-Performance Digital Processor: The system features a high-performance floating-point digital signal processor (DSP), providing a fast and precise vibration response, ensuring accurate and synchronized data processing.

The DVIA-MLP series by Daeil Systems offers a state-of-the-art solution for active vibration isolation, significantly enhancing the performance of scanning electron microscopes and other sensitive analytical instruments, while maintaining a compact design and superior functionality.