The Hi’Res-C probes suffer less contamination than silicon probes and are capable of obtaining many high-resolution scans, although they do require special care in use. Due to the small tip curvature radius, the tip-sample attraction force is minimized.
Advantages of Hi’Res-C are noticeable when scanning small areas (< 250 nm) and flat samples (Ra < 20 nm). On larger images, the resolution is similar to that of General Purpose probes.
Technical Features
Spike radius ................................... < 1 nm
Spike height ...................................100 - 200 nm
Spike material ...................................diamond-like
Overall coating:
Au overall coating ...................................30 nm
Cr overall sublayer ...................................20 nm
| Cantilever Series | Coatings | Length l, ± 5 μm | Width w, ± 3 μm | Thickness ± 0.5 μm | Freq. Rison. kHz Typical | Freq. Rison. kHz Range | Const. Force N/m Typical | Const. Force N/m Range |
|---|---|---|---|---|---|---|---|---|
| Hi’Res-C14 | /Cr-Au | 125 | 25 | 2.1 | 160 | 110-220 | 5.0 | 1.8-13 |
| Hi’Res-C15 | /Cr-Au | 125 | 30 | 4.0 | 325 | 265-410 | 40 | 20-80 |
| Hi’Res-C19 | /Cr-Au | 125 | 22.5 | 1.0 | 65 | 25-120 | 0.5 | 0.05-2.3 |
| Hi’Res-C18 | /Cr-Au | 225 | 27.5 | 3.0 | 75 | 60-90 | 2,8 | 1.2-5.5 |