PanScan Lumin

New Standard in cryogen-free LT SPM Systems for Nanoscience.
Brand: 
RHK Technology
Category: 
UHV STM/AFM Microscopes

RHK introduces the PanScan Lumin-SLT, a family of cryogenic STM/AFMs with integrated optics providing industry leading light collection efficiency. The Lumin-SLT’s combination of high efficiency optics and high stability SPM enables the study of the interplay among morphological, optical and electronic properties of a wide range of materials.

Ideal for:

  • Cathodoluminescence (CL)
  • Photoluminescence (PL)
  • STM Light Emmission (STM-LE)
  • Raman Spectroscopy

Key features

  • Up to 70% light collection efficiency
  • Optical wavelengths from Deep UV to Far IR
  • Integrated parabolic mirror with in-situ 3D nanopositioners
  • Atomic Scale Resolution from 9K to 400K
  • Simultaneous SPM and optical measurements
  • Cryogen-free and flow cryostat versions available
  • Ultra Low Drift measurements
Info Request

Videos

PanScan Lumin-SLT Webinar 3 Jan 23

News, events, promotions, webinars

09/03/2023
Go visit RHK STM and learn about their latest AFM UHV devices at a conference near you!

Application Fields

Surface Science
Material Science

Technical Features

  • LT STM and AFM
  • Chilled Tip & Sample at uniform temperature
  • mK & High Magnetic Field Compatible
  • Eliminates the need for expensive cryogens
  • Maintains temperature indefinitely
  • Never run out of liquid He during an experiment again!
  • Stable low temperature imaging for everyone
  • Atomic resolution 15-400 K
  • Optional 9-400 K version
  • XY drift as low as 0.2Å/hour
  • Z drift as low as 0.2Å/day
  • Superb STS
  • Integral X-Y Offsets
  • In-Vacuum Tip Exchange
  • STM and optional AFM-qPlus, switchable in vacuum
  • Sample size: 10mm x 10mm (standard), uses typical flat plate sample holder
  • Imaging from LT to 400K
  • Able to retract tip and re-approach in same area with high accuracy
  • Non-magnetic construction appropriate for high-Tesla environments
  • Coarse positioning XYZ: 5mm x 5mm x 8mm
  • Scan range: 6 μm x 6 μm XY at RT
  • Change probes without removing sample
  • Optional improved optical access for <4µm resolution
    • Precise positioning of the probe onto a specific area of the sample with a precision of better than 2 microns
    • Light and lens can be adjusted to provide optimum contrast for low contrast samples such as graphene
    • Capability available on up to three separate chamber ports
Info Request