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ACCESS-NC Probes are sharp silicon probes designed to allow a direct optical view of the AFM tip when imaging. ACCESS-NC is designed for tapping/noncontact mode.
Technical Features
| Cantilever Parameter | Nominal Value |
|---|---|
| Spring Constant (N/m) | 45 |
| Frequency (kHz) | 300 |
| Length (μm) | 160 |
| Width (μm) | 54 |
| Thickness (μm) | 5 |
| ROC | <10 |
| Tip Side Coating | None |
| Reflex Side Coating | None |