Schaefer will be attending with its booth at the workshop Science through Scanning Probe Microscopy 2013 (StSPM13). This workshop will take place in Bologna at the Istituto per lo Studio dei Materiali Nanostrutturati (ISMN) of the CNR (Area della Ricerca di Bologna), from 12 to 13 December. This event is a triennial italian meeting point dedicated to the people working in the SPM/AFM field, with the aim of describing and presenting the scientific advances achieved in Italy thanks to SPM techniques.
For this occasion Schaefer will present the new AFM Agilent, the model named 7500. Attached to this news you can find the technical data sheet and three pdf files with a technical literature regarding some application field, describing the enhancements obtained with this instrument.
At the same time we will be honoured to have on our booth the Applied Nanostructures chief. All the people at the worksop is welcome to come to our booth and discuss with Mr Ami Chand about the best probes to be utilized in relation to their applications and instruments. It will be possible to obtain free evaluation probes. You can also have some info about the new SThM module, a new one in the AppNano catalogue. Here below you can download some SThM module datasheet.
The new Agilent AFM 7500 and the Appnano chief in Bologna from the 12th to the 13th of December
Schaefer will be attending with its booth at the workshop Science through Scanning Probe Microscopy 2013 (StSPM13). This workshop will take place in Bologna at the Istituto per lo Studio dei Materiali Nanostrutturati (ISMN) of the CNR (Area della Ricerca di Bologna), from 12 to 13 December. This event is a triennial italian meeting point dedicated to the people working in the SPM/AFM field, with the aim of describing and presenting the scientific advances achieved in Italy thanks to SPM techniques.
For this occasion Schaefer will present the new AFM Agilent, the model named 7500. Attached to this news you can find the technical data sheet and three pdf files with a technical literature regarding some application field, describing the enhancements obtained with this instrument.
At the same time we will be honoured to have on our booth the Applied Nanostructures chief. All the people at the worksop is welcome to come to our booth and discuss with Mr Ami Chand about the best probes to be utilized in relation to their applications and instruments. It will be possible to obtain free evaluation probes. You can also have some info about the new SThM module, a new one in the AppNano catalogue. Here below you can download some SThM module datasheet.
Documents and Files
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