The products distributed by Schaefer

DRS-100

LEED Image Analysis System

Unprecedented high speed

The most versatile probe: a good choice for many applications

Lowest spring constant - 0.3 N/m (± 40%)

Versatile probe with a lower spring constant: 8 N/m (± 40%)

The high-spring constant RMN probe: 250 N/m (± 40%)

High spring constant probe for contact AFM imaging

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