The FemtoLEED Spectrometer DLD L1000 is an advanced and highly precise tool for Low-Energy Electron Diffraction (LEED). This spectrometer is designed to offer superior performance in surface analysis, thanks to a combination of cutting-edge technologies, such as the Delay Line Detector (DLD), which eliminates the need for a fluorescent screen and enables fully digital measurements.
Key Features
-
Delay Line Detector (DLD): This innovative detector provides exceptional linearity, minimizing background noise and improving temporal resolution, enabling highly accurate measurements.
-
Double Focusing Optics: Ensures a highly collimated electron beam, which is essential for obtaining accurate data under all conditions.
-
XY Configuration: Allows precise and accurate positioning of the sample, making it easy to analyze different areas without compromising measurement quality.
-
Optimized Energy Range: This spectrometer is perfect for the analysis of sensitive materials such as semiconductors, oxides, and thin films, due to its ideal energy range for electron diffraction.
Applications
The FemtoLEED Spectrometer DLD L1000 is used in a variety of advanced applications, including:
-
Surface Analysis: Ideal for studying single crystals, thin films, and 2D materials.
-
Surface Crystallography: Perfect for determining the atomic structure of surfaces, contributing to research in condensed matter physics and materials science.
-
Nanotechnology: Supports the characterization of materials on a nanometric scale, essential for the development of advanced devices and technologies.
Thanks to its precision, modularity, and reliability, the FemtoLEED Spectrometer DLD L1000 is the ideal choice for research laboratories and industries requiring advanced control in surface analysis.
Files
| Attachment | Size |
|---|---|
 FemtoLEED_DLDL1000_1.pdf | 2.03 MB |
| OCIVM_FemtoLEED_DLD_L1000_configuration_and_specifications.pdf | 123.63 KB |
Technical Features
-
Delay Line Detector (DLD):
- High linearity and precision in measurements.
- Low background counting rates for better temporal resolution.
- Fully digital measurements, with no need for fluorescent screens.
- Increases data reliability in surface analysis and crystallography applications.
Operating Energy:
- Variable energy range (generally between 0 and 5 keV) for better adaptability to different material types.
- Optimized for the analysis of sensitive materials, including thin films and single crystals.
Double Focusing Optics:
- Provides a collimated and highly stable electron beam, improving measurement resolution.
- The beam stability is crucial to reduce measurement errors and ensure optimal performance in LEED analysis.
Precise Positioning via XY Configuration:
- XY deflection for precise sample positioning.
- Enables accurate orientation of surfaces for direct analysis in specific areas of the sample.
Operating Pressure Range:
- The system is designed to operate at low vacuum pressures in the range of 10⁻⁶ – 10⁻⁷ Torr, an ideal condition for maintaining data quality in high-precision environments.
Gas Types:
- Reactive and noble gases are usable for surface analysis and for generating Auger and LEED signals.
Bakeability:
- The system is designed to be bakeable up to 250°C to facilitate cleaning and maintain the environment under ultra-high vacuum conditions.
Interface and Software:
- The detection system is supported by software that enables real-time data visualization and precise control of beam settings.
- Allows data to be analyzed in a fully digital mode, ensuring speed and accuracy in data collection and processing.