S neox Grand Format

The S Neox Grand Format represents the evolution of non-contact 3D scanning, combining metrological precision, high resolution, and fast data acquisition for large objects. Thanks to its advanced structured light technology and state-of-the-art optics, this system provides a reliable solution for industrial applications, scientific research, and advanced quality control.

Technology and Performance

• Dual-Scan Mode – Combined scanning mode for multi-scale acquisition, from large surfaces to microscopic details, without loss of accuracy.
• High resolution up to 5 µm – Precision optical sensors capture even the finest details while maintaining sub-micron accuracy.
• Customizable scanning volumes – Modular configurations adapt to different object sizes and geometries, with scanning areas exceeding 1 meter.
• Advanced illumination – Proprietary algorithms optimize contrast and reduce shadows, enhancing the capture of challenging surfaces such as glossy, transparent, or highly reflective materials.
• Acquisition speed up to 4 million points/sec – Dynamic pattern projection technology minimizes scanning time, improving workflow efficiency.
• Seamless software integration – Compatible with leading reverse engineering, dimensional inspection, and 3D modeling software, ensuring a smooth data processing experience.

Key Applications

• Manufacturing Industry – Quality control, dimensional inspection, and component digitization.
• Cultural Heritage – High-resolution digitalization of artworks, sculptures, and historical artifacts.
• Research & Development – Structural analysis, simulations, and advanced prototyping.
• Medical and Biometric Applications – Morphological studies and applications in orthopedics and prosthetics.