xTS – X-ray Tomography

The xTS by Psylotech is an innovative testing system designed for in situ X-ray tomography, providing a detailed three-dimensional analysis of materials under mechanical load. This tool allows real-time observation of the internal microstructure evolution, enabling advanced characterization of material mechanical responses.

Key Features

• High-resolution in situ testing. Enables monitoring of material behavior under load, improving the understanding of mechanical properties.

• Compatibility with X-ray tomography systems. Designed to integrate with advanced imaging tools, ensuring clear and detailed visualization.

• Optimized design for multi-scale experimentation. Ideal for testing a wide range of materials, from microstructures to advanced composites.

• High precision and control. The system ensures stable positioning and precise sample movement, reducing artifacts in the acquired images.

Applications

• Internal deformation analysis of materials
• Defect and fracture characterization
• Study of composite and porous material behavior
• Research on advanced materials for aerospace, biomedical, and manufacturing industries

Innovation and Reliability

Psylotech continues to push the boundaries of multi-scale mechanical testing, providing cutting-edge tools for materials research. With the xTS, users can obtain unprecedented data to improve material design, reliability, and performance in the most demanding industries.