Tuesday, April 2, 2019

New video! Performance of unique CPEM™ technique

New video! Performance of unique CPEM™ technique

Nanovision has brought the analysis and characterisation of graphene and 2D materials to the next level...

Check out this new video presenting the analysis of 2Dmaterials using the Nenovision AFM LiteScope in SEM!

LiteScope is equipped with unique technology called CPEM™ (Correlative Probe and Electron Microscopy) enabling simultaneous measurement of multiple signals!

Nenovision

Scanning Probe Microscope designed for easy integration into the Electron Microscopes.
Nenovision Litescope
Do you want to try with your samples? It's all free!

For more information don't hesitate to contact us!