New video! Performance of unique CPEM™ technique

Tuesday, April 2, 2019
New video! Performance of unique CPEM™ technique

Nanovision has brought the analysis and characterisation of graphene and 2D materials to the next level...

Check out this new video presenting the analysis of 2Dmaterials using the Nenovision AFM LiteScope in SEM!

LiteScope is equipped with unique technology called CPEM™ (Correlative Probe and Electron Microscopy) enabling simultaneous measurement of multiple signals!

Nenovision

NenoVision brings Something more...
Do you want to try with your samples? It's all free!

For more information don't hesitate to contact us!