Atomic force microscopy (AFM) is a particularly powerful technique for characterization of 2D materials including graphene and transition metal dichalcogenides like molybdenum disulfide (MoS2). AFM can easily measure not only topography but also electrical and mechanical...
Schaefer's Blog
Into this section you can find new products, new partners, news on the nanotechnology fields, on the vacuum and flow measurement, and on other fields of interest of our and yours business.
Wednesday, August 5, 2020
Monday, August 3, 2020
Check out this new article from Nick Hawkins & collaborators at the University of Oxford!
Novel co-spray drying technology was used to generate co-amorphous salts against biofilms. LS Instruments' ...
Tuesday, July 28, 2020
Why do we believe FluidFM can help solving some of the most critical challenges in CRISPR cell engineering?
What's the biggest story of Single Cell Analysis for 2019?
What are the biggest issues Genomics and Single Cell Analysis researches face in 2020?
What will 2020 hold for...
Friday, July 24, 2020
September 16, 09:30 – 12:00 (GMT/UTC +2)
Don't miss the chance to showcase your FluidFM-related applications, results and experiences to the FluidFM community.
Submission deadline: July 31, 2020
Tuesday, July 21, 2020
Wed, Jul 29, 2020 4:00 PM - 5:00 PM CEST
Surface roughness is an important measurement for thin films and substrates in a wide range of applications including semiconductor electronics, data storage, optics and other glass components, as well as thin films and coatings...
