Scientific Equipment
Schaefer's Blog
Into this section you can find new products, new partners, news on the nanotechnology fields, on the vacuum and flow measurement, and on other fields of interest of our and yours business.
Last News
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Latest News
Thursday, September 10, 2026
Schaefer SEE at the SGI–SIMP 2026 Joint Congress in Padua
15–17 September 2026 | Padova Congress, Padua, Italy
Schaefer SEE is pleased to participate as a sponsor and exhibitor at...
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Latest News
Wednesday, September 9, 2026
Meet Schaefer SEE at NanoInnovation 2026 - Rome, September 14-18, 2026
Schaefer SEE will participate as a sponsor and exhibitor at NanoInnovation 2026, taking place in Rome from 14–18 September.
Location: Faculty of...
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Latest News
Saturday, September 5, 2026
Schaefer SEE at AITEM 2026: Advanced Solutions for Electron Microscopy and 3D Optical Metrology
Schaefer SEE Srl will be attending AITEM 2026, presenting advanced solutions for material characterization, electron microscopy and surface metrology.
Visitors will be...
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Latest News
Friday, August 28, 2026
Schaefer SEE and Izon Science at the III National Congress of the Italian Core Facilities Network
Schaefer SEE is pleased to announce its participation, together with partner Izon Science, at the III Congresso Nazionale della Rete Italiana Core Facilities,...
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Latest News
Sunday, August 23, 2026
Sample Preparation and SEM Observation, in One Compact and Complete Solution
The G5 Ion Sputter Coater by GSEM is a compact, easy-to-use, and cost-effective instrument for preparing samples destined for SEM analysis.
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Friday, May 30, 2025
Friday, May 16, 2025
While the semiconductor industry continues to push the limits of device performance and miniaturization, 3D metrology remains essential for achieving consistent yield, reliable quality, and faster time-to-market.
In this webinar, discover how 3D optical metrology...
Tuesday, March 11, 2025
Not all characterisation techniques are made equal.
TRPS offers precise, single-particle measurements for detailed size, concentration, and zeta potential analysis, making it ideal for complex samples.
DLS, in contrast, provides quick, broad measurements of particle...
Friday, February 16, 2024
CSI and Schaefer SEE are organizing a demo tour in Italy to present the Galaxy Dual for Multimode and the AFM Nano-Observer II.
Give your AFM a second life: the Galaxy Dual Controller renews and improves the performance of your AFM with...
Sunday, November 26, 2023
With great enthusiasm, we invite you to an upcoming webinar dedicated to introducing Tomocube's latest innovation: TomoAnalysis v1.7.
TomoAnalysis is a holotomography image analysis software that provides a range of customizable procedures of analysis pipelines to address diverse user needs...