Schaefer's Blog

Into this section you can find new products, new partners, news on the nanotechnology fields, on the vacuum and flow measurement, and on other fields of interest of our and yours business.

Last News

Tuesday, August 8, 2017

Enhanced Darkfield Hyperspectral Microscopy - Cytoviva at Nanosafety 2017

The Enhanced Darkfield Hyperspectral Microscopy (EDFM-HS) of Cytoviva enables optical observation and spectral characterization of a wide range of nanomaterials as they interact with both biological and materials-based matrixes. No labeling or other special sample preparation is...

Tuesday, August 8, 2017

Enhanced Darkfield Hyperspectral Microscopy - Cytoviva at Nanosafety 2017

The Enhanced Darkfield Hyperspectral Microscopy (EDFM-HS) of Cytoviva enables optical observation and spectral characterization of a wide range of nanomaterials as they interact with both biological and materials-based matrixes. No labeling or other special sample preparation is...

Monday, July 3, 2017

Workshop: State of the art in 3D Surface Metrology - Rovigo - July 26, 2017

Schaefer South-East Europe Srl is pleased to announce this workshop in 3D profilometry, which will be held by the end of July in Italy.
Here below are all the details.

Location: Lab TE.SI. Rovigo,
Viale Porta Adige, 45
Rovigo — 45100

Date:...

Tuesday, June 20, 2017

High Definiton Kelvin Force Microscopy - BIMODAL HD-KFM

Electric characterization with the atomic force microscope has an increasing demand among the AFM community to solve new research topics in nanotechnology like energy harvesting, polymer or organic based electronics, or new advances in the semiconductor industry...

Monday, June 12, 2017

Nuove tecnologie per la misura della struttura superficiale: Confocal Fusion e Continuous Confocal - Webinar

Sensofar Metrology has developed new innovative software features for their 3-in-1 S-line 3D surface metrology systems. Two new measurement technologies –Confocal Fusion & Continuous Confocal– represent significant new developments in 3D surface metrology, and underline Sensofar’s...

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