The Enhanced Darkfield Hyperspectral Microscopy (EDFM-HS) of Cytoviva enables optical observation and spectral characterization of a wide range of nanomaterials as they interact with both biological and materials-based matrixes. No labeling or other special sample preparation is...
Schaefer's Blog
Into this section you can find new products, new partners, news on the nanotechnology fields, on the vacuum and flow measurement, and on other fields of interest of our and yours business.
Tuesday, August 8, 2017
The Enhanced Darkfield Hyperspectral Microscopy (EDFM-HS) of Cytoviva enables optical observation and spectral characterization of a wide range of nanomaterials as they interact with both biological and materials-based matrixes. No labeling or other special sample preparation is...
Monday, July 3, 2017
Schaefer South-East Europe Srl is pleased to announce this workshop in 3D profilometry, which will be held by the end of July in Italy.
Here below are all the details.
Location: Lab TE.SI. Rovigo,
Viale Porta Adige, 45
Rovigo — 45100
Date:...
Tuesday, June 20, 2017
Electric characterization with the atomic force microscope has an increasing demand among the AFM community to solve new research topics in nanotechnology like energy harvesting, polymer or organic based electronics, or new advances in the semiconductor industry...
Monday, June 12, 2017
Sensofar Metrology has developed new innovative software features for their 3-in-1 S-line 3D surface metrology systems. Two new measurement technologies –Confocal Fusion & Continuous Confocal– represent significant new developments in 3D surface metrology, and underline Sensofar’s...