AFM Galaxy Dual Controller

Seamless Compatibility:
Proven expertise in operating a wide range of AFM/SPM systems, including Multimode AFM, Pico SPM (STM), and Agilent/Keysight scanning probe microscopes (models 5100, 5500, 5600LS, and 54xx)
Supports and preserves all established operating modes, including STM, Contact, AC, Phase, MFM, EFM, PFM, LFM, and EC modes

Advanced New Modes for your old AFM

• HD-KFM: No lift, higher sensitivity & resolution
• ResiScope & Soft ResiScope: Resistance & current measurements from 10² to 10¹² ohms and 50 fA to mA range, even on soft samples
• Soft Intermittent Contact Mode: Measure adhesion, stiffness, Young's modulus with quantitative accuracy

High-Performance Hardware:

• Real integrated lock-in for enhanced measurement capabilities
• Low-noise electronics and power supply
• USB 24-bit drive architecture for high resolution and smart integration

User-Friendly Software

• Intuitive NanoSolution interface
• One-click mode selection and automatic electronics configuration
• Guided workflow for efficient image acquisition
• Auto-settings for quick results and expert controls for in-depth analysis

Easy to use interface

The NanoSolution user interface is very intuitive and versatile;

• AFM mode selection quickly and automatically configures the electronics in just one click requiring no help from the user
• The interface, composed of clickable buttons and a guided workflow allows easy configuration of the AFM for • efficient image acquisition
• The top view allows for simple laser alignment and adjustment by displaying a view of the laser reflection on • the tip. The side view allows a really easy pre-approach without damage to the tip and sample.
• The auto setting allows the user to obtain an AFM image in just a few clicks while access to the parameters • gives an expert the opportunity to exercise all of the AFM’s capabilities for a very high quality image.