Nano-Observer II

The Nano-Observer II is a state-of-the-art atomic force microscope (AFM) that combines flexibility, exceptional performance, and ease of use. Designed for both experienced users and beginners, it offers a wide range of features for imaging and characterization at the nanoscale.

Intuitive and Easy-to-Use Design

• Top and side view of the tip/sample area for an efficient pre-approach process

• Compact AFM head with optional pre-aligned tip/laser holder

• AutoScan software: easier and faster automatic scanning

• Automatic approach: fast, gentle, and fully automated final approach

Autogain: real-time active adjustment of AFM feedback gains

Setpoint Conditions: Preset setpoints (for soft, medium, or hard interaction)

High-Performance Scanning

• High-resolution, low-noise scanning capability

• Scanning over both large and small areas without the need to change the scan head

• Consistent resolution across all scan sizes

Integration of Advanced Technologies

• New low-noise 24-bit Galaxy USB AFM controller

• High-quality integrated lock-in amplifiers

• Support for advanced modes: Phase, PFM, EFM, KFM...

• Key Modes: HD-KFM and ResiScope for high-resolution imaging

AFM + Glove Box
Exploring the properties of different materials often requires a controlled environment. A glove box allows precise control of humidity or gases (e.g., N₂, Ar), protecting sensitive samples—such as two-dimensional materials, lithium, organic, or photovoltaic materials—from environmental effects.

AFM + Optical Coupling
The Nano-Observer II features an open design that enables integration with optical microscopy techniques (UV, IR, Raman, etc.), allowing optimized illumination for applications such as photovoltaic studies.