MountainsSPIP®

Advanced particle analysis

• Detect and quantify particles, pores, grains and other features of any shape and size on any surface
• Benefit from application-oriented segmentation techniques
• Group particles into classes based on characteristics
• Generate statistics and graphics (scatter plot, box plot, control chart, histogram etc.)

Force spectroscopy

• Visualize force curves and automatically pre-process with denoising, normalization and calibration tools
• Automatically detect adhesion events and calculate parameters
• Generate wormlike chain (WLC) models
• Analyze series of force curves and generate statistics (control charts, scatter plots, histograms) on any parameter
• Visualize force volume data & display interactive parameter maps
• Filter force volume and extract slices or individual force curves interactively

Correlative analysis

• Combine SPM images with data from other instruments (SEMs, 3D optical microscopes, confocal microsopes etc.) to perform correlative analysis.
• Overlay high-resolution topography images acquired with an atomic force microscope (AFM) on RGB images acquired by a microscope with a larger field of view (SEM, fluorescence, optical images).

Multi-channel imaging & analysis

Scanning probe microscopes commonly image several interactions simultaneously. Through their different modes, SPMs produce multiple datasets at the same location on the sample (topography, conductivity or stiffness for example).

• Handle multi-channel images as easily and as efficiently as if they were dealing with a simple topography image
• Visualize different channels in 3D at the touch of a button
• Apply analysis to a single channel or to all channels
• Extract multi-channel cross-sections
• Explore correlations between the different channels

Learn more: www.digitalsurf.com/news/multi-channel-data-how-to-study-correlations/

Lateral calibration

• In images with regular patterns, quantify the linearity distortions and scaling distortions of a surface, using a unit cell.
• Use these values as correction factors to correct the linearity and the scaling of other surfaces.

Tip deconvolution

Correct the effect of the tip on the measured surface.

• Simulate tip geometry
• Estimate tip geometry using Villarrubia's "Blind reconstruction" method
• Save tip geometry and re-use it for the deconvolution of other surfaces

Surface texture analysis

• Seperate roughness and waviness components of surfaces using the latest ISO 16610 advanced filtering techniques, including robust Gaussian and spline filters.
• Access ISO parameters: ISO 25178 height (Sa, Sq, Ssk, Sku, Sz, etc.,) and functional (Smr, Smc, Sxp) parameters, ISO 4287 primary and roughness parameters (Ra, Rq, Rsk, Rmr, Rdc, Rdq, RPc, etc.) and more.