Scientific Equipment
Into this section you can find new products, new partners, news on the nanotechnology fields, on the vacuum and flow measurement, and on other fields of interest of our and yours business.
The G5 Ion Sputter Coater by GSEM is a compact, easy-to-use, and cost-effective instrument for preparing samples destined for SEM analysis.
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We are pleased to introduce the new TomoAnalysis tutorial video series, created to help users get the most out of their Tomocube imaging data.
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In material analysis, seeing the surface of a sample is often only the first step. A tabletop SEM allows laboratories to observe morphology, topography,...
The Enhanced Darkfield Hyperspectral Microscopy (EDFM-HS) of Cytoviva enables optical observation and spectral characterization of a wide range of nanomaterials as they interact with both biological and materials-based matrixes. No labeling or other special sample preparation is...
Schaefer South-East Europe Srl is pleased to announce this workshop in 3D profilometry, which will be held by the end of July in Italy.
Here below are all the details.
Location: Lab TE.SI. Rovigo,
Viale Porta Adige, 45
Rovigo — 45100
Date:...
Electric characterization with the atomic force microscope has an increasing demand among the AFM community to solve new research topics in nanotechnology like energy harvesting, polymer or organic based electronics, or new advances in the semiconductor industry...
Sensofar Metrology has developed new innovative software features for their 3-in-1 S-line 3D surface metrology systems. Two new measurement technologies –Confocal Fusion & Continuous Confocal– represent significant new developments in 3D surface metrology, and underline Sensofar’s...
We are pleased to announce that we will be present at the "3rd BOLOGNA SPM WORKSHOP - SCANNING PROBE MICROSCOPY AND SPECTROSCOPY FOR MINERAL, BIOLOGICAL AND MATERIAL SCIENCES", on July 14, 2017 - Bologna.
The workshop will be held at the Dept. of Biological, Geological and Environmental...