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Mikromasch introduces a new line of AFM probes: OPUS AFM
The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.
OPUS™ tips are available on all standard cantilever types for all commonly used AFM applications, including high speed scanning. OPUS™ AFM probes also offer all major coatings that are being used in AFM.
Other important features of OPUS™ AFM probes are:
Evaluation samples will be provided free of charge to interested AFM users.
Documents and Files
The tip is located exactly at the end of the cantilever, which allows exact positioning of the tip apex over the region of interest on the sample surface.
Our state-of-the-ar t manufacturing process ensures consistency in cantilever and tip proper ties. High quality factor, smooth resonance cur ves, good cantilever reflectivity and excellent tip sharpness are only a few of the many advantages you can count on with every single OPUS™ silicon micro cantilever.
All OPUS™ silicon micro cantilevers are manufactured from highly n-doped monocrystalline silicon with resistivity in the range 0.01 - 0.025 Ohm.cm for static charge dissipation. The cantilever and chip sur face is a (100) plane and the cantilevers point in the <110> direction.
OPUS™ micro cantilever holder chips have industry standard dimensions (3.4 x 1.6 x 0.315 mm) and fit all AFM systems that use unmounted probes. All single cantilever models feature alignment grooves on the back side of the chip.
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Mikromasch