Schaefer's Blog

Into this section you can find new products, new partners, news on the nanotechnology fields, on the vacuum and flow measurement, and on other fields of interest of our and yours business.

Last News

Wednesday, September 25, 2013

The Hiden EQS-series of quadrupole mass spectrometer probes were introduced for measurement of external ions in a vacuum environment, specifically for application to the SIMS surface analysis technique. The systems are now even further enhanced by the addition...

Monday, September 2, 2013

In Q3, Agilent announced that exclusive SMM mode is now available to 5500 users thanks to our introduction of a universal SMM nose cone. The newly enhanced electrical measurement capabilities of the 5500 complement this flagship AFM system’s world-class imaging performance, outstanding...

Wednesday, August 28, 2013

Since the release of topoStitch™ three months ago, Image Metrology has received tons of valuable user feedback.

After having listened to experts and scientists from all over the world, they just had to start coding the next version. On the 15th of August they have released topoStitch™ 2...

Friday, July 26, 2013

From Monday the 23th to Friday the 27th of September 2013, Schaefer Italy is organizing a roadshow around italy, to present the new Sensofar 3D non-contact optical profilometer, the S Neox.

Mr Alberto Aguerri from Sensofar will attend this roadshow, he will describe the instrument, answer...

Thursday, July 4, 2013

The ESPion Langmuir-style probe from Hiden Analytical is believed to be the most versatile commercial electrostatic probe currently available. The probe automatically reports the critical plasma characteristics of electron density and energy distribution, electron temperature, ion density,...

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