Schaefer SEE at NANOSEA 2026 – Bringing Cutting-Edge Nano-Characterization to Catania

Event - Congress -Workshop

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Tuesday 09 June 2026 - 09:30 to Friday 12 June 2026 - 13:30

Schaefer SEE at NANOSEA 2026 – Bringing Cutting-Edge Nano-Characterization to Catania
Post publication date: 
Sunday, March 29, 2026

Schaefer SEE will be participating in NANOSEA 2026, the 9th International Conference on NANOstructures and Nanomaterials Self-Assembly, to be held in Catania, Sicily (Italy) from June 9 to 12, 2026.
NANOSEA is one of the most important European forums dedicated to the science of self-assembled nanostructures and nanomaterials — a field that sits at the crossroads of materials science, nanotechnology, and applied physics. This year's edition returns to Sicily after ten years, and we are proud to be part of it alongside two of our key technology partners.

Advanced AFM Electrical Characterization with CS Instruments
Advanced AFM Electrical Characterization with CS Instruments

At the event, we will be showcasing the latest innovations from Concept Scientific Instruments (CSI), a French leader in advanced Atomic Force Microscopy. In particular, we will present two landmark technologies for electric nano-characterization:

  • ResiScope™ III — a breakthrough approach to current/resistance AFM measurements (c-AFM). Unlike conventional c-AFM setups, ResiScope™ III eliminates common artifacts such as current saturation, surface charging, and capacitive effects. Its most remarkable capability is the ability to measure current and resistance across 10 orders of magnitude — from 50 pA to 1 mA — within the same scan area, with no hardware or software adjustments required. This makes it uniquely suited for samples combining highly insulating and highly conductive phases, such as organic polymer blends, perovskites, or 2D materials relevant to photovoltaics and solid-state batteries.
  • HD-KFM™ III — an advanced implementation of Kelvin Force Microscopy (KFM) that delivers significantly improved sensitivity and lateral resolution for surface potential measurements at the nanoscale. HD-KFM™ III also enhances Magnetic Force Microscopy (MFM) by actively cancelling the electrostatic component of long-range tip–sample interactions (EFC), enabling true decoupling of magnetic and electrostatic contributions — a critical capability when characterizing soft magnetic materials.

Together, these two technologies represent the state of the art in electric and electrostatic nano-characterization, directly supporting research into next-generation energy materials and devices.

Compact SEM Imaging with Semplor's NANOS
Compact SEM Imaging with Semplor's NANOS

We will also be presenting the NANOS benchtop SEM by Semplor, our partner from Eindhoven. The NANOS is a next-generation tabletop scanning electron microscope that brings high-resolution SEM imaging and integrated EDS elemental analysis to virtually any lab environment — with no dedicated infrastructure, no vibration isolation, and no service engineer required for routine maintenance.
The NANOS comes standard with a Secondary Electron Detector (SED), a 4-quadrant Backscattered Electron Detector (BSD), and embedded EDS in a single compact unit. The Nanos achieves sub-8 nm resolution and is engineered for plug-and-play installation, making it ideal for R&D, education, and industrial quality control applications that do not require dedicated infrastructure. One of its standout features is that the electron source can be replaced by the user in minutes, with no service visit required; dramatically reducing downtime and cost of ownership.

Why Nanosea?

NANOSEA 2026 will be held at the Hotel Nettuno in Catania from June 9 to 12, bringing together researchers and industry from across Europe and beyond. For us, it is the ideal setting to connect with the scientific community working on nanostructured materials, surface characterization, and emerging energy technologies: exactly the application space where the tools we represent make the greatest impact.
If you are attending NANOSEA 2026 and would like to learn more about ResiScope™ III, HD-KFM™ III, or the Semplor NANOS, we would love to meet you there. Feel free to reach out in advance at info@schaefer-tec.it.

Related products 

Advanced and Versatile Atomic Force Microscope
HD-KFM mode - An ultra-sensitive implementation of KFM
An ultra-sensitive implementation of KFM
ResiScope II -  AFM Electrical characterization
AFM Electrical characterization
Nanos - The next generation tabletop SEM
The next generation tabletop SEM with integrated EDS

Partner 

CSI Concept Scientific Instruments

Semplor