High-performance hardware naturally enables fast measurements. In the smartWLI series, however, the available computing power is leveraged not only for speed, but also specifically to assess the quality of measurement data. As a result, an additional layer of information is generated alongside...
Schaefer's Blog
Into this section you can find new products, new partners, news on the nanotechnology fields, on the vacuum and flow measurement, and on other fields of interest of our and yours business.
Tuesday, June 2, 2026
Friday, May 29, 2026
In partnership with RTEC Instruments, we present the most advanced solutions for the tribological and mechanical characterization of surfaces
We are exhibiting at the 10th AIT Workshop – "Tribology and Industry", organized by the Italian Tribology Association (AIT) in...
Monday, May 18, 2026
The scientific work by Francesca Sbrana, entitled "Label-free three-dimensional imaging and quantitative analysis of living fibroblasts and myofibroblasts by holotomographic microscopy" and published in the...
Monday, May 4, 2026
On Star Wars Day, CSInstruments marks a milestone: 20 years at the forefront of Atomic Force Microscopy. To celebrate, the company has launched a special anniversary page packed with surprises — an AFM-themed quiz to win exclusive gifts, a comic book series dedicated to the...
Thursday, April 16, 2026
We will be exhibiting at the International Scanning Probe Microscopy Conference with the NanoObserver II AFM and the Galaxy Dual Controller electronics. We are also organising on-site demonstrations at your lab in the days following the event.
We are pleased to announce...
